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Pressemeddelelse

Smoltek Nanotech Holding AB: Smoltek's CNF-MIM Capacitors Reliability Validated by Major Capacitor Manufacturer

Smoltek Nanotech Holding

This press release is an English version of the previously published Swedish version, which has interpretive precedence.

Smoltek Nanotech Holding AB (publ) ("Smoltek" or "the Company") announces that an independent, third-party reliability test of the Company's CNF-MIM capacitor technology has confirmed the previously reported internal life test results published on February 5, 2026. The independent validation substantially reduces technical risk in the commercialization process and strengthens Smoltek's credibility in ongoing negotiations with industrial partners.

The third-party operational life test verified stable performance over 1,000 hours under applied voltage - with zero failures and no observed degradation in capacitance, equivalent series resistance (ESR), or insulation resistance. Leakage current remained in the picoampere range, consistent with Smoltek's previously reported (February 5, 2026) insulation resistance of 1,000 GΩ at rated voltage.

The external validation was conducted under conditions similar to the internal life test Smoltek previously reported. The successful outcome further de-risks the technology and strengthens Smoltek's position in ongoing commercial discussions with industrial partners.

"With both internal and independent third-party validation completed we have demonstrated that CNF-MIM capacitors can meet stringent reliability criteria under realistic and accelerated conditions. This is an important step toward industrial qualification and commercialization," says Magnus Andersson, CEO of Smoltek.

Validation under strict conditions 
The external life test subjected the CNF-MIM capacitors to continuous operation for 1,000 hours at 85°C with constant voltage bias, simulating prolonged use in thermally demanding semiconductor environments such as AI accelerators, advanced processors, high-performance computing (HPC) systems and RF applications. Testing at an elevated temperature represents an acceleration of aging mechanisms, providing confidence in long-term field reliability and operational stability.

Strategic and Commercial Implications 
Ultra-low leakage and stable electrical parameters at elevated temperature are critical for next-generation semiconductor applications. Reduced leakage current minimizes stress, limits heat generation, and improves long-term stability - key requirements in AI data centers and advanced computing systems where power density and thermal management are decisive factors.

The independent validation substantially reduces technical risk in the commercialization process and strengthens Smoltek's credibility in ongoing industrial dialogues towards volume manufacturing.